Citation :

Niranjana Gurushankar , 2023. "Physical Verification Techniques in Advanced Semiconductor Nodes" ESP International Journal of Advancements in Computational Technology (ESP-IJACT)  Volume 1, Issue 2: 146-148.

Abstract :

The drive towards ever-smaller and more complex semiconductor designs brings significant challenges for ensuring accuracy and manufacturability. This paper explores the evolving landscape of physical verification techniques in 2023, examining how the industry is adapting to these challenges. It investigates the rising use of machine learning to analyze complex design data, the adoption of cloud computing to manage the growing computational burden, and the increasing importance of formal verification methods for guaranteeing design correctness. Additionally, the paper examines how advanced lithography-aware verification techniques are crucial for successful manufacturing at advanced nodes. Through real-world examples, this research offers insights into how these techniques are impacting design timelines and chip quality, and discusses potential future trends such as quantum computing and security verification.

References :

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Keywords :

Physical Verification, Semiconductor, Advanced Nodes, Machine Learning, Cloud Computing, Formal Verification, Quantum Computing, Security Verification.